Advantest Debuts Industry's First Fully Integrated 12 GHz Quad-core Monolithic RF Module and Turnkey RF Test Cell Solution at Se
14 Julho 2008 - 4:59PM
PR Newswire (US)
Unparalleled flexibility provides lowest cost of ownership for
multi-site production testing SAN FRANCISCO, July 14
/PRNewswire-FirstCall/ -- Advantest Corporation
(TSE:6857TSE:NYSE:TSE:ATE), the world's leading supplier of
semiconductor test equipment, is introducing its new 12GHz RF test
cell solution at Semicon West and demonstrating a new 12GHz RF
module for the T2000 open-architecture SoC test system. Advantest
will exhibit its products and technology in West Hall booth 7447,
on July 15 through 17, at San Francisco's Moscone Center.
Advantest's new, powerful RF test cell consists of the T2000 LS
mainframe configured with the new 12GHz RF module and integrated
with the M4841 Handler, using a unique low noise parallel interface
that offers the industry's only single-vendor, quad-site parallel
testing environment. The RF test cell solution from Advantest
incorporates the ATE industry's first fully integrated 12 GHz
quad-core monolithic test module. Currently capable of testing 4 RF
devices in parallel, this air-cooled, parallel, quad-DUT module
affords manufacturers an unmatched cost of test advantage.
Furthermore, with 32 RF pins, each with access to high performance
VSG and VSA supporting 40 MHz of complex modulation bandwidth, this
module offers the industry's highest RF pin density for addressing
multi-DUT, multi-band transceivers and Multiple Input Multiple
Output (MIMO) device architectures. The tester and handler are
integrated into a test cell with proprietary interface design that
optimizes performance, maintainability, functionality and
throughput for superior cost of ownership performance. At Semicon,
Advantest will demonstrate its multi-DUT RF solution enabling tools
through a high-speed link with its Gunma facility, on a remote
WiMAX quad-DUT device. Turnkey RF test cell solution redefines
"high-volume" manufacturing Advantest's new RF test cell solution
is unique for its single-vendor tester-handler integration,
bringing a highly parallel, high-performance, turn-key
manufacturing test solution to RF device manufacturing. The RF test
cell solution has a number of uniquely optimized features that
offer semiconductor designers, manufacturers and assembly-test
companies high performance, high accuracy, and turn-key ease of use
at low cost of test. -- Highest density RF module instrumentation
at 32-12GHz ports routed to 4-vectored sources and receivers allows
dedicated resources to every complex RF SOC device pin. --
Scalability to an unprecedented 128 RF ports and 16-vectored
sources and receivers. -- Multi-site innovation and patent pending
RF shielding to improve yield. -- 36 port quad-core RF simplifies
correlation provides faster time to market. -- Plug-n-Play
high-performance site isolator module supports volume production.
-- ATE industry's first fully integrated 12 GHz quad-core
monolithic RF module. -- Optimized handler-tester connectivity for
superb uptime, reliability and ease of use. --
OPENSTAR(R)-compliant open test system architecture and the latest
pick-and-place handler technology providing flexibility and
scalability that leverage ATE investment while meeting the
challenges of testing complex, sophisticated ICs. -- An extremely
compact ATE footprint, resulting in real estate and operating
savings. Tester/Handler Characteristics OPENSTAR(R) compliant and
designed for compactness and modularity, Advantest's T2000 LS
mainframe is a low-cost test system for today's high-functionality
SoC consumer devices. Demand is ongoing and growing for analog,
digital and mixed signal devices that provide features and mobile
communications for increasingly sophisticated consumer electronics
as well as automotive, medical, transportation and other
infrastructure applications. These highly sophisticated, densely
designed integrated circuits (ICs) and the fast-paced,
price-sensitive markets they target, require test solutions that
meet their technical challenges as well as their cost challenges.
Advantest designed the T2000 LSMF and its entire test cell solution
to meet these needs. The test head of the LS mainframe is designed
to accommodate different modules for the varied applications needed
to test complex SoCs. Offering high-speed analog, digital and RF
test capability to perform highly parallel testing of complex SOC
devices, Advantest's new solutions deliver significant cost
reductions and a smaller footprint, together with greater
performance and versatility. Rounding out the test cell is
Advantest's M4841 Dynamic Handler. Offering industry-leading
high-throughput handling for volume testing of consumer devices
such as MCUs and DSPs, the handler supports complex ICs and their
advanced packaging technologies, including BGA, CSP and QFP. The
M4841 is capable of parallel testing up to 16 devices and delivers
a high throughput of 18,500 devices-per-hour. About Advantest
Advantest Corporation is the world's leading supplier of automatic
test equipment (ATE) to the semiconductor industry. Advantest's
SoC, logic, memory, mixed-signal and RF testers and device handlers
are integrated into the most advanced semiconductor fabrication
lines in the world. Founded in Tokyo in 1954, Advantest established
its North American subsidiary in 1982 and its European subsidiary
in 1984. More information is available at
http://www.advantest.com/. DATASOURCE: Advantest Corporation
CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, Web
site: http://www.advantest.com/
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