Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 22
16 Agosto 2023 - 5:05PM
Aehr Test Systems (
NASDAQ: AEHR),
a worldwide supplier of semiconductor test and
burn-in equipment, today announced that it will participate in
the 4th Annual Needham Virtual Semiconductor and SemiCap 1x1
Conference on Tuesday, August 22, 2023. Aehr Test President and CEO
Gayn Erickson and CFO Chris Siu will be hosting virtual meetings
with investors throughout the day.
“We look forward to discussing our unique semiconductor
production test and burn-in solutions and the markets
they serve with investors and shareholders,” said Gayn
Erickson, President and CEO of Aehr Test Systems. “Aehr Test
provides complete production solutions for improving quality,
reliability, and yield of semiconductors such as silicon carbide
devices used in electric vehicles and charging infrastructure,
silicon photonics devices used in data centers and 5G
infrastructure and also for new applications such as optical
input/output (I/O) and co-packaged optics devices that are on the
horizon. Wafer level test and burn-in of these and other devices
that are used in applications where quality, reliability, safety,
and security are critical to the customers and the semiconductor
suppliers who supply to them are significant growth drivers for
Aehr Test.”
For additional information, or to schedule a virtual meeting
with Aehr management, please contact your Needham representative,
or Aehr’s investor relations firm, MKR Investor Relations, at
aehr@mkr-group.com.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a leading provider of
test solutions for testing, burning-in, and stabilizing
semiconductor devices in wafer level, singulated die, and package
part form, and has installed thousands of systems worldwide.
Increasing quality, reliability, safety, and security needs of
semiconductors used across multiple applications, including
electric vehicles, electric vehicle charging infrastructure, solar
and wind power, computing, data and telecommunications
infrastructure, and solid-state memory and storage, are driving
additional test requirements, incremental capacity needs, and new
opportunities for Aehr Test products and solutions. Aehr has
developed and introduced several innovative products including the
FOX-P™ families of test and burn-in systems and FOX
WaferPak™ Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier
and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer
contact and singulated die/module test and burn-in systems that can
test, burn-in, and stabilize a wide range of devices such as
leading-edge silicon carbide-based and other power semiconductors,
2D and 3D sensors used in mobile phones, tablets, and other
computing devices, memory semiconductors, processors,
microcontrollers, systems-on-a-chip, and photonics and integrated
optical devices. The FOX-CP system is a low-cost single-wafer
compact test solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The FOX WaferPak
Contactor contains a unique full wafer contactor capable of testing
wafers up to 300mm that enables IC manufacturers to perform test,
burn-in, and stabilization of full wafers on the FOX-P systems. The
FOX DiePak Carrier allows testing, burning in, and stabilization of
singulated bare die and modules up to 1024 devices in parallel per
DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a
time. For more information, please visit Aehr Test Systems’ website
at www.aehr.com.
Contacts: |
|
|
Aehr Test
SystemsChris SiuChief Financial Officercsiu@aehr.com |
|
MKR Investor Relations
Inc.Todd Kehrli or Jim ByersAnalyst/Investor Contact(323)
468-2300aehr@mkr-group.com |
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